Characterization & Quality control
TECHNICAL SERVICE
CSEM SA
R2R R2P Wafer-scale
[INSPECTION] Optical inspection [INSPECTION] Reliability testing [SOFTWARE SOLUTIONS] optical design and simulations (commercial and custom solution) [SOFTWARE SOLUTIONS] characterization: acquisition, handling, processing, analysis of metrological data [SOFTWARE SOLUTIONS] CAD related software solutions
AR/VR Consumer electronics Decoration & Luxury Healthcare & Life sciences Imagers & Displays Lighting Optical instrumentation Packaging Security & Branding Solar, Energy & Daylight Transportation ALL

Surface profile:

  • AFM
  • SEM
  • Optical (up to x150)
  • Laser Scannig Confocal (upto 150x and 60x60 cm2 stage)
  • Tactile 3D profilometry
  • Predicted optical function from measured surface topology

Optical:

  • 2D luminance distributino (Konica Minolta CA2500 Luminance camera)
  • Integraled luminous flux (50cm int. sphere)
  • Luminous intensity distribution (in-house)
  • Transmittance / Reflectance / Absorption / Haze
  • Laser beam profile
  • OCT

Material stability:

  • Climate chambers
  • Mechanical stability (peel/bending/elongation)

Measurable surfaces up to 60x60 cm2, depending on the chosen characterization equipment.