Material Characterization
Fraunhofer FEP
R2R R2P Wafer-scale
[INSPECTION] Electrical testing [INSPECTION] Optical inspection [INSPECTION] Mechanical testing [INSPECTION] Reliability testing [INSPECTION] Other
AR/VR Automotive Consumer electronics Decoration & Luxury Healthcare & Life sciences Imagers & Displays Lighting Optical communication Optical instrumentation Packaging Security & Branding Solar, Energy & Daylight Transportation Other ALL
  • Surface & Layer properties
    • White Light Interferrometry (WLI) - up to 50x & stitching
    • Confocal Microscopy (CM) - up to 50x
    • Optical Microscopy (OM)
    • Scanning Electron Microscopy (SEM)
    • Scanning Electron Microscopy cross-section (X-SEM)
    • Atomic Force Microscopy (AFM)
    • Profilometry
    • X-Ray Diffraction (XRD)
    • X-Ray Reflectivity (XRR)
    • Hyper Spectral Imaging (HSI)
  • Optical
    • UV/VIS/NIR-Spectrometry: Transmission / Reflection / Absorption (direct and diffuse)
    • Optical Modelling
    • Fourier Transform Infrared Spectroscopy (FT-IR, ATR)
    • Haze & Gloss
    • Spectroscopic Ellipsometry (SE)
  • Ageing / Material Stability
    • Salt spray test
    • Climate chambers (damp-heat, temperature cycle)
    • Outdoor weathering test
    • Mechancial Stability (Bending, Scratch, Elongation, Adhesion / Peel)

A wide range of coatings, materials, substrates and sample sizes can be characterized.

Specifications depend on the chosen characterization method, sample type and aim of characterization. Please contact us in advance.

Bruker D8 diffractometer for XRD and XRR
Bruker D8 diffractometer for XRD and XRR